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1

Applications of spherical aberration correction in STEM and TEM

Lazar, S, Etheridge, J, Dwyer, C, Freitag, B, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 312 KB

english, 2010

2

Electron Energy Loss Spectroscopy of Bi2FeCrO6 Thin Films on SrRuO3/SrTiO3

Gunawan, L, Nechache, R, Harnagea, C, Pignolet, A, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2007

Language:

english

File:

PDF, 494 KB

english, 2007

3

Applications of High-Resolution EELS Near-Edge Structures in Complex Oxides

Radtke, G, Maunders, C, Lazar, S, Lozano-Gorrin, AD, Greedan, JE, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2006

Language:

english

File:

PDF, 283 KB

english, 2006

4

Electron Energy Loss Near-Edge Structures in Complex Perovskites

Botton, GA, Maunders, C, Shao, Y, Wu, M-Y, Lazar, S, Etheridge, J, Whitfield, HJ

Journal:

Microscopy and Microanalysis

Year:

2007

Language:

english

File:

PDF, 453 KB

english, 2007

5

Investigation of the Hexagonal Perovskite Ba3Ti2RuO9 using High Resolution STEM and High Resolution EELS

Maunders, C, Radtke, G, Robertson, M, Lazar, S, Whitfield, HJ, Etheridge, J, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2008

Language:

english

File:

PDF, 284 KB

english, 2008

6

Radial Concentration Profile Reconstruction from EDX Mapping of Au-Pt Nanoparticles

Braidy, N, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2006

Language:

english

File:

PDF, 193 KB

english, 2006

7

Fabrication and Morphology of ZnO and ZnS Nanoribbon Heterostructure

Kim, P-S G, Murphy, M, Zhou, XT, Couillard, M, Sham, TK, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2006

Language:

english

File:

PDF, 541 KB

english, 2006

8

Morphology, Electronic and Optical Properties of Si Nanowires

Kim, P-S G, Botton, GA, Sham, TK

Journal:

Microscopy and Microanalysis

Year:

2006

Language:

english

File:

PDF, 433 KB

english, 2006

9

An Investigation of the Valency Distribution in Cu1.3Mn1.7O4 using Electron Energy Loss Spectroscopy Near Edge Structures

Maunders, C, Martin, B, Wei, P, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2007

Language:

english

File:

PDF, 182 KB

english, 2007

10

Compositional Analysis in InAs/InGaAlAs/InP Quantum Wire Structures with Electron Energy Loss Spectroscopy

Cui, K, Andrei, CM, Hul'ko, O, Robinson, B, Robertson, MD, Thompson, DA, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2007

Language:

english

File:

PDF, 281 KB

english, 2007

11

Quantitative Characterisation of Surfaces and Defects on PtRu Nanoparticles Using Combined Exit Wave Restoration and Aberration-Corrected TEM

Chang, LY, Maunders, C, Baranova, EA, Bock, C, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2008

Language:

english

File:

PDF, 319 KB

english, 2008

12

Direct Structural Investigation of Bi3.25La0.75Ti3O12 thin films on SrRuO3/(111) SrTiO3

Gunawan, L, Gautreau, O, Harnagea, C, Pignolet, A, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2008

Language:

english

File:

PDF, 2.89 MB

english, 2008

13

Investigation of 6T@SWCNT by Cs-Corrected Transmission Electron Microscopy

Bártová, B, Lazar, S, Botton, GA, Milko, M, Hébert, C

Journal:

Microscopy and Microanalysis

Year:

2009

Language:

english

File:

PDF, 3.25 MB

english, 2009

14

Quantitative Characterisation of Surface Defects and Composition on PtRu Nanoparticles Using Aberration-Corrected TEM/STEM

Chang, L-Y, Lazar, S, Baranova, EA, Bock, C, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2009

Language:

english

File:

PDF, 474 KB

english, 2009

15

Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

Lazar, S, Chang, L-Y, Gunawan, L, Shao, Y, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2009

Language:

english

File:

PDF, 1.15 MB

english, 2009

16

Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration

Chang, L-Y, Lazar, S, Bártová, B, Botton, GA, Hébert, C, Morral, A Fontcuberta i

Journal:

Microscopy and Microanalysis

Year:

2009

Language:

english

File:

PDF, 971 KB

english, 2009

17

Atom-by-Atom Analysis of Rare-Earth Dopants implanted in Silicon

Couillard, M, Radtke, G, Knights, AP, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 445 KB

english, 2010

18

HAADF STEM and EELS Investigations of Grain Boundaries in SrTiO3

Dudeck, KJ, Couillard, M, Cockayne, DJH, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 1.37 MB

english, 2010

19

Aberration-Corrected TEM Study of Defects in III-V Films Grown on Si

Vajargah, SH, Couillard, M, Shao, Y, Tavakoli, S, Kleiman, R, Preston, J, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 1.09 MB

english, 2010

20

TEM Analysis of EuS/CdSe Nano Heterostructures

Rossouw, D, Mirkovic, T, Scholes, GD, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 588 KB

english, 2010

21

Probing Phonon and Infrared-Plasmons in Nanoscale Interfaces

Lagos, MJ, Hohenester, U, Trugler, A, Amarasinghe, V, Feldman, LC, Batson, PE, Botton, GA

Journal:

Microscopy and Microanalysis

Year:

2019

Language:

english

File:

PDF, 466 KB

english, 2019